The pulse sequence image sensor is a high-speed bionic image sensor, and its image quality deteriorates because of the influence of noise. Spatial noise is attributed to the mismatch of the comparator and other devices, and the temporal noise arises from random noise and single-code flicker noise under the synchronous readout mechanism. This study establishes a noise model based on noise research and the sensor principle, and simulates and predicts the time error caused by noise under different parameters such as photocurrent and integral voltage drop. Results show that increasing the integral voltage drop will reduce the fluctuation of the time error rate caused by single-code flicker noise and the size of the time error rate caused by other noise sources. Further, increasing the photocurrent will increase the fluctuation of the time error rate caused by single-code flicker noise and increasing the junction capacitance will increase the time error rate caused by temporal noise. Finally, the noise characteristics of a chip are evaluated in the pulse interval reconstruction mode and the aforementioned analysis is validated. The findings of this study have guiding significance for optimizing the design of pulse sequence sensors, handling noise, and reconstructing stable images.