Automatic blemish inspection for TFT-LCD based on polynomial surface fitting

[in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 10 >Page 108 > Article

Opto-Electronic Engineering
Vol. 33, Issue 10, 108 (2006)

Automatic blemish inspection for TFT-LCD based on polynomial surface fitting

[in Chinese] and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese]. Automatic blemish inspection for TFT-LCD based on polynomial surface fitting[J]. Opto-Electronic Engineering, 2006, 33(10): 108 Copy Citation Text

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References

[1] William K.PRATT.Machine vision methods for automatic defect detection in liquid crystal displays[J].Advanced Imaging,1998,13(4):52-54.

[2] Y.MORI,K.TANAHASHHI.Extraction and evaluation of mura in liquid crystal displays[J].SPIE,2001,4471:299-306.

[3] LI Wen-ju,LIANG De-qun,CUI Lian-yan,et al.A novel approach for vehicle license plate tilt correction[J].Information and Control,2004,33(2):231-235.

[4] CHENG Zheng-xing.Data fitting[M].Xi(an:Xi(an Jiaotong University Press,1986.

[5] SHEN Kui-chang.Implementation of best polynomial approximation[M].Shanghai:Shanghai Science & Technology Press,1984.

[6] Yumi MORI,Ryoji YOSHITAKE,Tohru TAMURA.Evaluation and discrimination method of 'mura' in liquid crystal displays by just noticeable difference observation[J].SPIE,2002,4902:715-722.

[in Chinese], [in Chinese]. Automatic blemish inspection for TFT-LCD based on polynomial surface fitting[J]. Opto-Electronic Engineering, 2006, 33(10): 108

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