• Opto-Electronic Engineering
  • Vol. 33, Issue 10, 108 (2006)
[in Chinese] and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Automatic blemish inspection for TFT-LCD based on polynomial surface fitting[J]. Opto-Electronic Engineering, 2006, 33(10): 108 Copy Citation Text show less

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    [in Chinese], [in Chinese]. Automatic blemish inspection for TFT-LCD based on polynomial surface fitting[J]. Opto-Electronic Engineering, 2006, 33(10): 108
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