• Acta Optica Sinica
  • Vol. 38, Issue 7, 0722001 (2018)
Weilin Cheng1、2, Fang Zhang1, Dongliang Lin1、2, Aijun Zeng1、2, Baoxi Yang1、2, and Huijie Huang1、2、*
Author Affiliations
  • 1 Laboratory of Information Optics and Optoelectronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2 University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/AOS201838.0722001 Cite this Article Set citation alerts
    Weilin Cheng, Fang Zhang, Dongliang Lin, Aijun Zeng, Baoxi Yang, Huijie Huang. High Precision Correction Method of Illumination Field Uniformity for Photolithography Illumination System[J]. Acta Optica Sinica, 2018, 38(7): 0722001 Copy Citation Text show less

    Abstract

    A high precision correction method of illumination field uniformity for photolithography illumination system is proposed. The correction ability and accuracy are improved by the optimization of the fingers' fore-end shape and arrangement of the finger array uniformity corrector. The simulation results show that the correction accuracy of the finger array uniformity corrector is better than 0.2%, when fingers are staggered arrangement. In addition, the correction accuracy of the finger array uniformity corrector is better than 0.16%, when fingers are chamfered, staggered and double layouts arrangement, which is about twice as high as general finger array uniformity corrector.
    Weilin Cheng, Fang Zhang, Dongliang Lin, Aijun Zeng, Baoxi Yang, Huijie Huang. High Precision Correction Method of Illumination Field Uniformity for Photolithography Illumination System[J]. Acta Optica Sinica, 2018, 38(7): 0722001
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