• Infrared and Laser Engineering
  • Vol. 45, Issue 12, 1221003 (2016)
Wang Yuanzhang1、2、3、*, Zhuang Qinqin1、2, Huang Haibo1、2, and Cai Li′e1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/irla201645.1221003 Cite this Article
    Wang Yuanzhang, Zhuang Qinqin, Huang Haibo, Cai Li′e. Study on thermal strain of ZnTe/Si(211) and ZnTe/GaAs(211) heterostructures[J]. Infrared and Laser Engineering, 2016, 45(12): 1221003 Copy Citation Text show less
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    [2] Shu Tianyu, Lu Pengqi, Zhang Bingpo, et al. Molecular beam epitaxy and characterizations of PbTe grown on GaAs(211) substrates using CdTe/ZnTe buffers[J]. J Crystal Growth, 2015, 420: 17-21.

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    [7] Zhang Haiyan, Guan Jian′an, Zhuang Fulong, et al. Measurement and error analysis of low temperature deformation of infrared focal plane arrays[J]. Infrared and Laser Engineering, 2016, 45(5): 0504001.

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    [12] Saringer C, Tkadletz M, Mitterer C. Restrictions of stress measurements using the curvature method by thermally induced plastic deformation of silicon substrates[J]. Surface and Coatings Technology, 2015, 274: 68-75.

    Wang Yuanzhang, Zhuang Qinqin, Huang Haibo, Cai Li′e. Study on thermal strain of ZnTe/Si(211) and ZnTe/GaAs(211) heterostructures[J]. Infrared and Laser Engineering, 2016, 45(12): 1221003
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