New nonuniformity correction method of microbolometer

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 32 >Issue 12 >Page 78 > Article

Opto-Electronic Engineering
Vol. 32, Issue 12, 78 (2005)

New nonuniformity correction method of microbolometer

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. New nonuniformity correction method of microbolometer[J]. Opto-Electronic Engineering, 2005, 32(12): 78 Copy Citation Text

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References

[1] William J.PARRISH,James T.WOOLAWAY.Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array[P].US patent:5756999,1998-05-26.

[2] Belenky ALEXANDER,Fish ALEXANDER,Hamami SHY,et al.Method for expanding the dynamic range of the readout integration circuit for uncooled microbolometer sensors[J].Optical Engineering,2004,43(6):1274-1275.

[4] FIEQUE Bruno,CRASTES Arnaud,TISSOT Jean-luc,et al.320×240 uncooled microbolometer 2D array for radiometric and process control applications[J].SPIE,2004,5251:114-120.

[5] David L.PERRY,Eustace L.DERENIAK.Linear theory of nonuniformity correction in infrared staring sensor[J].Optical Engineering,1993,32(8):1854-1859.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. New nonuniformity correction method of microbolometer[J]. Opto-Electronic Engineering, 2005, 32(12): 78

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