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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 12 >Page 78 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 12, 78 (2005)
    New nonuniformity correction method of microbolometer
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New nonuniformity correction method of microbolometer[J]. Opto-Electronic Engineering, 2005, 32(12): 78 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New nonuniformity correction method of microbolometer[J]. Opto-Electronic Engineering, 2005, 32(12): 78
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