• Laser & Optoelectronics Progress
  • Vol. 58, Issue 23, 2316001 (2021)
Xianglin Zhan and Shuwen Li*
Author Affiliations
  • College of Electronic Information and Automation, Civil Aviation University of China, Tianjin 300300, China
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    DOI: 10.3788/LOP202158.2316001 Cite this Article Set citation alerts
    Xianglin Zhan, Shuwen Li. Evaluation Method of Micro-Debonding Defects in FMLs Based on Local Defect Resonance[J]. Laser & Optoelectronics Progress, 2021, 58(23): 2316001 Copy Citation Text show less
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    Xianglin Zhan, Shuwen Li. Evaluation Method of Micro-Debonding Defects in FMLs Based on Local Defect Resonance[J]. Laser & Optoelectronics Progress, 2021, 58(23): 2316001
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