Investigating the Mueller Matrix of Objects at Different Incident Angles

Siyuan He; Zhiyin Zhou; Xiaofan Tian; Ange Wang; Yan Wang; Zhe Song

doi:10.3788/LOP202158.1726001

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 17 >Page 1726001 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 17, 1726001 (2021)

Investigating the Mueller Matrix of Objects at Different Incident Angles

Siyuan He, Zhiyin Zhou, Xiaofan Tian, Ange Wang, Yan Wang, and Zhe Song^*

Author Affiliations

College of Physics and Electronic Technology, Liaoning Normal University, Dalian , Liaoning 116029, China

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DOI: 10.3788/LOP202158.1726001 Cite this Article Set citation alerts

Siyuan He, Zhiyin Zhou, Xiaofan Tian, Ange Wang, Yan Wang, Zhe Song. Investigating the Mueller Matrix of Objects at Different Incident Angles[J]. Laser & Optoelectronics Progress, 2021, 58(17): 1726001 Copy Citation Text

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Fig. 1. Schematic of Mueller matrix measuring device

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Variation curves of Mueller matrix elements with incident angle. (a) m00; (b) m01/m00; (c) m10/m00; (d) m11/m00; (e) m22/m00; (f) m23/m00; (g) m32/m00; (h) m33/m00

Fig. 2. Variation curves of Mueller matrix elements with incident angle. (a) m₀₀; (b) m₀₁/m₀₀; (c) m₁₀/m₀₀; (d) m₁₁/m₀₀; (e) m₂₂/m₀₀; (f) m₂₃/m₀₀; (g) m₃₂/m₀₀; (h) m₃₃/m₀₀

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Fig. 3. Variation curves of different characteristics with incident angle.（a）Diattenuation property；（b）polarizance property；（c）retardance property；（d）depolarization property

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