• Laser & Optoelectronics Progress
  • Vol. 59, Issue 13, 1300003 (2022)
Yifan Xu1、2, Jingzhen Shao1, Ying Lin1, Yangjie Shi1、2, and Xu Liang1、*
Author Affiliations
  • 1Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, Anhui , China
  • 2University of Science and Technology of China, Hefei 230026, Anhui , China
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    DOI: 10.3788/LOP202259.1300003 Cite this Article Set citation alerts
    Yifan Xu, Jingzhen Shao, Ying Lin, Yangjie Shi, Xu Liang. Research Progress in Laser Surface Polishing of Hard and Brittle Materials[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1300003 Copy Citation Text show less
    Comparison of long-pulse laser and ultra-fast pulse laser processing materials[7]
    Fig. 1. Comparison of long-pulse laser and ultra-fast pulse laser processing materials[7]
    Schematic diagram of surface periodic structure formed in the SOM mechanism[9]
    Fig. 2. Schematic diagram of surface periodic structure formed in the SOM mechanism[9]
    Multiphysics process of CO2 laser processing of fused silica optics[12]
    Fig. 3. Multiphysics process of CO2 laser processing of fused silica optics[12]
    Influence of different polishing methods on surface roughness of materials[16]
    Fig. 4. Influence of different polishing methods on surface roughness of materials[16]
    Polishing results at different laser scanning speeds[17]. (a) Not polished; (b) 90 mm/s; (c) 45 mm/s; (d) 20 mm/s
    Fig. 5. Polishing results at different laser scanning speeds[17]. (a) Not polished; (b) 90 mm/s; (c) 45 mm/s; (d) 20 mm/s
    Effect comparison before and after laser polishing [30]
    Fig. 6. Effect comparison before and after laser polishing [30]
    Scanning electron microscope images of the CVD-diamond surfaces [37]
    Fig. 7. Scanning electron microscope images of the CVD-diamond surfaces [37]
    Yifan Xu, Jingzhen Shao, Ying Lin, Yangjie Shi, Xu Liang. Research Progress in Laser Surface Polishing of Hard and Brittle Materials[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1300003
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