• Journal of Infrared and Millimeter Waves
  • Vol. 24, Issue 3, 174 (2005)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. PHOTOLUMINESCENCE OF LOW-DIMENSIONAL SEMICONDUCTOR STRUCTURES UNDER PRESSURE[J]. Journal of Infrared and Millimeter Waves, 2005, 24(3): 174 Copy Citation Text show less

    Abstract

    Photoluminescence of some low-dimensional semiconductor structures has been investigated under pressure. The measured pressure coefficients of In_ 0.55 Al_ 0.45 As/Al_ 0.5 Ga_ 0.5 As quantum dots with average diameter of 26, 52 and 62 nm are 82, 94 and 98 meV/GPa, respectively. It indicates that these quantum dots are type-Ⅰ dots. On the other hand, the measured pressure coefficient for quantum dots with 7 nm in size is -17meV/GPa, indicating the type-Ⅱ character. The measured pressure coefficient for Mn emission in ZnS:Mn nanoparticles is -34.6meV/GPa, in agreement with the predication of the crystal field theory. However, the DA emission is nearly independent on pressure, indicating that this emission is related to the surface defects in ZnS host. The measured pressure coefficient of Cu emission in ZnS:Cu nanoparticles is 63.2 meV/GPa. It implies that the acceptor level introduced by Cu ions has some character of shallow level. The measured pressure coefficient of Eu emission in ZnS:Eu nanoparticles is 24.11meV /GPa, in contrast to the p redication of the crystal field theory. Itmay be due to the strong interaction between the excited state of Euions and the conduction band of ZnS host.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. PHOTOLUMINESCENCE OF LOW-DIMENSIONAL SEMICONDUCTOR STRUCTURES UNDER PRESSURE[J]. Journal of Infrared and Millimeter Waves, 2005, 24(3): 174
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