[1] Xue Hui,Shen Weidong,Gu Peifu et al.. Thickness measurement of thin film based on white-light spectral interferometry[J]. Acta Optica Sinica,2009,29(7):1877-1880

[2] J. Schwider,L. Zhou. Dispersive interferometric profilometer [J]. Opt. Lett.,1994,19(13):995-997

[3] A. V. Tikhonravov,P. W. Baumeister,K. V. Popov. Phase properties of multilayers[J]. Appl. Opt.,1997,36(19):4382-4392

[4] Frédéric Lemarquis,Pierre Riaud. Thin-film achromatic phase shifters for nulling interferometry:design approach [J]. Appl. Opt.,2003,42(34):6919-6928

[5] K. K. Shih,D. B. Dove. Thin film materials for the preparation of attenuating phase shift masks [J]. J. Vac. Sci. Technol. B,1994,12(1):32-36

[6] Ki-Nam Joo,Seung-Woo Kim. Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser [J]. Opt. Express,2006,14(13):5954-5960

[7] V. N. Kumar,D. N. Rao. Using interference in the frequency domain for precise determination of the thickness and refractive indices of normal dispersive materials [J]. J. Opt. Soc. Am. B,1995,12(9):1559-1563

[8] Yuqiang Deng,Weijian Yang,Chun Zhou et al.. Wavelet-transform analysis for group delay extraction of white light spectral interferograms [J]. Opt. Express,2009,17(8):6038-6043

[9] Xue Hui,Shen Weidong,Gu Peifu et al.. Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry[J]. Chin. Opt. Lett.,2009,7(5):446-448

[10] P. Hlubina,J. Luňek,D. Ciprian et al.. Windowed Fourier transform applied in the wavelength domain to process the spectral interference signals [J]. Opt. Commun.,2008,281(9):2349-2354

[11] Shen Weidong,Liu Xu,Ye Hui et al.. A new Method for determination of the optical constants and thickness of thin film [J]. Acta Optica Sinica,2004,24(7):885-889

[12] P. Hlubina. White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion [J]. Acta Physica Slovaca,2005,55(4):387-393

[13] U. Schnell,E. Zimmermann,R . Dndliker. Absolute distance measurement with synchronously sampled white-light channelled spectrum interferometry pure [J]. Appl. Opt.,1995,4(5):643-651

[14] E. D. Palik. Handbook of Optical Constants of Solids [M]. Orlando:Academic Press,1995

[15] H. A. Macleod. Thin-Films Optical Filters [M]. Institute of Physics Publishing,UK,2001

[16] Li Xinhong,Zhang Haijun,Zhang Dongxian. Quantitative phase imaging system with active phase stabilization based on white-light interferometry[J]. Acta Optica Sinica,2008,28(7):1279-1282