• Opto-Electronic Engineering
  • Vol. 46, Issue 8, 180504 (2019)
Liang Nan*, Zhang Feiran, Cai Shuai, Li Bo, and Li Tao
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.12086/oee.2019.180504 Cite this Article
    Liang Nan, Zhang Feiran, Cai Shuai, Li Bo, Li Tao. Research on the test methods of charge accumulating TDICMOS detector[J]. Opto-Electronic Engineering, 2019, 46(8): 180504 Copy Citation Text show less
    References

    [1] Wang D J, Shen H H, Song Y L, et al. Modeling and experimental investigation on the PRNU noise of TDI CCD[J]. Acta Photonica Sinica, 2012, 41(2): 232–235.

    [2] Chen L F, Zhang X S, Lin J M, et al. Signal-to-noise ratio evaluation of a CCD camera[J]. Optics & Laser Technology, 2009, 41(11): 574–579.

    [3] De Moor P, Robbelein J, Haspeslagh L, et al. Enhanced time delay integration imaging using embedded CCD in CMOS technology[C]//Proceedings of 2014 IEEE International Electron Devices Meeting, San Francisco, CA, USA, 2014: 4.6.1–4.6.4.

    [4] Li J. The design and implementation of test circuit about multi-spectral time delay integration charge coupled device[D]. Chengdu: University of Electronic Science and Technology of China, 2015: 49–51.

    [5] Li Y B. Infrared focal plane detection technology based on TDI-CCD[J]. Infrared, 2006, 27(9): 29–33.

    [6] Ercan A, Haspeslagh L, De Munck K, et al. Prototype TDI sensors in embedded CCD in CMOS technology[C]//Proceedings of the International Image Sensor Workshop, Location, 2013.

    [7] Xu C. Design and research on active pixels of TDI CMOS image sensor[D]. Tianjin: Tianjin University, 2013: 7–18.

    [8] Xu X N. Research and design of the high accuracy analog accumulator for TDI image sensors[D]. Tianjin: Tianjin University, 2012: 73.

    [9] Wang D J, Dong B, Li W M, et al. Influence of TDI CCD charge transfer on imaging quality in remote sensing system[J]. Optics and Precision Engineering, 2011, 19(10): 2500–2506.

    [10] Irie K, McKinnon A E, Unsworth K, et al. A technique for evaluation of CCD video-camera noise[J]. IEEE Transactions on Circuits and Systems for Video Technology, 2008, 18(2): 280–284.

    [11] Liu Z X, Wan Z, Li X S, et al. Influence factors on SNR of TDICCD space camera[J]. Optics and Precision Engineering, 2015, 23(7): 1829–1837.

    [12] Wang D J, Kuang H P. Experimental study of the effects on signal noise ratio and dynamic range caused by analog gain for CCD[J]. Acta Physica Sinica, 2011, 60(7): 637–642.

    [13] Ding K. Photo-generated charge transfer efficiency of CMOS image sensor simulation and research[D]. Harbin: Harbin Engineering University, 2015: 8–12.

    Liang Nan, Zhang Feiran, Cai Shuai, Li Bo, Li Tao. Research on the test methods of charge accumulating TDICMOS detector[J]. Opto-Electronic Engineering, 2019, 46(8): 180504
    Download Citation