• Opto-Electronic Engineering
  • Vol. 46, Issue 8, 180504 (2019)
Liang Nan*, Zhang Feiran, Cai Shuai, Li Bo, and Li Tao
Author Affiliations
  • [in Chinese]
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    DOI: 10.12086/oee.2019.180504 Cite this Article
    Liang Nan, Zhang Feiran, Cai Shuai, Li Bo, Li Tao. Research on the test methods of charge accumulating TDICMOS detector[J]. Opto-Electronic Engineering, 2019, 46(8): 180504 Copy Citation Text show less

    Abstract

    With the increasing demand for high resolution, high speed transmission and low power dissipation in space remote sensing, TDICMOS detector based on charge accumulating will become an important part of video detectors. No matter in process or in structure, the detector is essentially different from the traditional TDICCD and CMOS detector with digital accumulating. Therefore, many original methods for testing the performance parameters of the detector cannot be applied to the TDICMOS detector based on charge accumulating. This paper proposes the test methods of charge-DN factor, full well charges, transfer efficiency, readout noise based on TDICMOS characteristics. We also verify these test methods by experiment, prove the correctness of these testing methods and the feasibility of the engineering. The results provide important basis for the application of TDICMOS camera in the future.
    Liang Nan, Zhang Feiran, Cai Shuai, Li Bo, Li Tao. Research on the test methods of charge accumulating TDICMOS detector[J]. Opto-Electronic Engineering, 2019, 46(8): 180504
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