Author Affiliations
Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, Changchun 130033, Chinashow less
Fig. 1. Three co-axial quartz tube: (a) schematic picture and (b) working picture.
Fig. 2. Microscope testing result on RB–SiC: (a) before PCET (200×); (b) after PCET (200×); (c) after PCET (2000×).
Fig. 3. Microscope testing result on S-SiC: (a) before PCET (200×); (b) before PCET (2000×); (c) fabricated with PCET (200×); (d) fabricated with PCET (2000×).
Fig. 4. Microscope testing result (200×) on fused silicon fabricated with PCET: (a) before PCET; (b) after PCET.
Fig. 5. Working pictures: (a) Zygo NewView 7200; (b) Mitutoyo Surftest SJ-410.
Fig. 6. Testing result with on fused silica workpiece: (a) Zygo NewView 7200 before fabrication with PCET; (b) Mitutoyo Surftest SJ-410 before fabrication with PCET; (c) Mitutoyo Surftest SJ-410 after fabrication with PCET.
Fig. 7. Testing result with Zygo NewView 7200 on RB-SiC workpiece: (a) before fabrication with PCET; (b) after fabrication with PCET.
Fig. 8. Testing result with Mitutoyo Surftest SJ-410: (a) after fabrication with PCET on RB–SiC workpiece; (b) before PCET on S-SiC sample; (c) after PCET on S-SiC sample.
Fig. 9. Testing result with Zygo NewView 7200 on Si workpiece (unpolished sample after coating on RB–SiC): (a) before fabrication with PCET; (b) after fabrication with PCET.
Fig. 10. Surface roughness of three different materials fabricated with PCET: 1, fused silicon; 2, RB–SiC; 3, S-SiC; 4, Si.
Material | Fused Silica | RB–SiC | Si |
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RF power (W) | 1000 | 1000 | 1000 | Cooling Gas Flow (slm) | 15 | 15 | 15 | Plasma Gas Flow (sccm) | 300–2000 | 300–2000 | 300–2000 | (sccm) | 0–100 | 0–100 | 0–100 | (sccm) | 0–30 | 0–30 | 0–30 | Working Distance (mm) | 25 | 25 | 25 | Sample Temperature (°C) | 215 | 105 | 160 |
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Table 1. Experimental Parameters