Surface Welding Defect Detection Based on Michelson Interferometer

Lü Sihang; Hongchang Ding; Yang Xiang; Yongkun Liu

doi:10.3788/LOP202158.1912005

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 19 >Page 1912005 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 19, 1912005 (2021)

Surface Welding Defect Detection Based on Michelson Interferometer

Lü Sihang¹, Hongchang Ding², Yang Xiang^1、*, and Yongkun Liu¹

Author Affiliations

¹College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun , Jilin 130022, China

²College of Mechanical and Electrical Engineering, Changchun University of Science and Technology, Changchun , Jilin 130022, China

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DOI: 10.3788/LOP202158.1912005 Cite this Article Set citation alerts

Lü Sihang, Hongchang Ding, Yang Xiang, Yongkun Liu. Surface Welding Defect Detection Based on Michelson Interferometer[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1912005 Copy Citation Text

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Lü Sihang, Hongchang Ding, Yang Xiang, Yongkun Liu. Surface Welding Defect Detection Based on Michelson Interferometer[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1912005

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