Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Optica Sinica >Volume 29 >Issue 7 >Page 2022 > Article
    • Acta Optica Sinica
    • Vol. 29, Issue 7, 2022 (2009)
    Study on Preparation and Performances of 1064 nm, 532 nm Frequency-doubled Antireflection Coating for LBO
    Tan Tianya1、2、*, Shao Jianda3, Fan Zhengxiu3, Yu Hanjiang1、2, Wu Wei1、2, and Guo Yongxin1、2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    DOI: Cite this Article Set citation alerts
    Tan Tianya, Shao Jianda, Fan Zhengxiu, Yu Hanjiang, Wu Wei, Guo Yongxin. Study on Preparation and Performances of 1064 nm, 532 nm Frequency-doubled Antireflection Coating for LBO[J]. Acta Optica Sinica, 2009, 29(7): 2022 Copy Citation Text show less
    Cited By
    Article index updated: May. 25, 2024
    Citation counts are provided from Researching.
    The article is cited by 1 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (16)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Tan Tianya, Shao Jianda, Fan Zhengxiu, Yu Hanjiang, Wu Wei, Guo Yongxin. Study on Preparation and Performances of 1064 nm, 532 nm Frequency-doubled Antireflection Coating for LBO[J]. Acta Optica Sinica, 2009, 29(7): 2022
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology