• Opto-Electronic Engineering
  • Vol. 31, Issue 1, 29 (2004)
[in Chinese]1、2, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Phase-shifting interferometry to the flatness of a compact disk[J]. Opto-Electronic Engineering, 2004, 31(1): 29 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese]. Phase-shifting interferometry to the flatness of a compact disk[J]. Opto-Electronic Engineering, 2004, 31(1): 29
    Download Citation