• High Power Laser and Particle Beams
  • Vol. 32, Issue 11, 112001 (2020)
Jie Xu1、2, Baozhong Mu1、2、*, Liang Chen1、2, Wenjie Li1、2, Xinye Xu1、2, Xin Wang1、2, Zhanshan Wang1、2, Xing Zhang3, and Yongkun Ding4
Author Affiliations
  • 1Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
  • 2School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • 3Laser Fusion Research Center, CAEP, Mianyang 621900, China
  • 4Institute of Applied Physics and Computational Mathematics, Beijing 100088, China
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    DOI: 10.11884/HPLPB202032.200133 Cite this Article
    Jie Xu, Baozhong Mu, Liang Chen, Wenjie Li, Xinye Xu, Xin Wang, Zhanshan Wang, Xing Zhang, Yongkun Ding. Progress of grazing incidence X-ray micro-imaging diagnosis technology[J]. High Power Laser and Particle Beams, 2020, 32(11): 112001 Copy Citation Text show less

    Abstract

    High-precision X-ray imaging diagnosis is the key to understanding the implosion process and revealing unknown physical problems at the ignition scale. X-ray microscope based on grazing incidence reflection, combined with sub-nanometer ultra-smooth spherical or aspherical mirror, can achieve high-resolution imaging with spatial resolution better than 5 μm. This paper introduces the development and application of foreign X-ray microscopic imaging technology in the field of ICF research, highlights the progress of China’s high-resolution X-ray Kirkpatrick-Baez (KB) microscope, multi-channel X-ray KB microscope and large-field X-ray KBA microscope. The research plan for the next stage of ultra-high resolution X-ray microscopic imaging is analyzed. Through continuous technological innovation, China's X-ray microscopic imaging diagnostic capabilities have reached the internationally advanced level.
    Jie Xu, Baozhong Mu, Liang Chen, Wenjie Li, Xinye Xu, Xin Wang, Zhanshan Wang, Xing Zhang, Yongkun Ding. Progress of grazing incidence X-ray micro-imaging diagnosis technology[J]. High Power Laser and Particle Beams, 2020, 32(11): 112001
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