• Acta Optica Sinica
  • Vol. 33, Issue 9, 922005 (2013)
Cao Zhen*, Li Yanqiu, and Liu Fei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/aos201333.0922005 Cite this Article Set citation alerts
    Cao Zhen, Li Yanqiu, Liu Fei. Manufacturable Design of 16~22 nm Extreme Ultraviolet Lithographic Objective[J]. Acta Optica Sinica, 2013, 33(9): 922005 Copy Citation Text show less

    Abstract

    Extreme ultraviolet lithography is one of the promising technologies for 16~22 nm node of lithography. Design of the extreme ultraviolet lithographic projection objective needs not only to meet the demand of imaging quality and resolution but also to consider the manufacturability. Two projection objectives with numerical apertures of 0.3 and 0.32, respectively, are designed in the 26 mm×1.5 mm exposure area to meet the demands of manufacture, measurement and fabrication. The optical performance and manufacturability of the two projection objectives are analyzed and compared in detail. Combining with the resolution enhancement technology, the two projection objectives can meet the requirements of 22 nm and 16 nm node of lithography.
    Cao Zhen, Li Yanqiu, Liu Fei. Manufacturable Design of 16~22 nm Extreme Ultraviolet Lithographic Objective[J]. Acta Optica Sinica, 2013, 33(9): 922005
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