Xiaofeng Liu, Yuan’an Zhao, Liping Peng, Xiaoshuang Wang, Dawei Li, Jianda Shao. Application problems of liquid crystal phase modulators to high power lasers[J]. High Power Laser and Particle Beams, 2020, 32(3): 032003
- High Power Laser and Particle Beams
- Vol. 32, Issue 3, 032003 (2020)
Fig. 1. Typical damage morphology of ITO/glass at a lower fluence (near the LIDT). (b), (c), and (d) show local magnified views of micro-areas outlined by the rectangles 1, 2, and 3 in (a), respectively
Fig. 2. Typical damage morphology and depth profile of the ITO/glass sample at a higher fluence (near 100% damage probability)
Fig. 3. Typical damage morphologies of the PI/ITO/glass sample
Fig. 4. Temperature distribution of the irradiated center in the samples. The dashed lines represent the vaporization temperature of the ITO film
Fig. 5. Schematic diagram of measuring phase modulation of the liquid crystal device induced by the high-average-power laser[35]
Fig. 6. Morphologies observed by the polarized light microscope for decrease in the laser power density from 141 W/cm2 to 133 W/cm2
Fig. 7. Transmitted He-Ne light intensity after the analyzer varies with voltage apllied on the liquid crystal device when the liquid crystal device is irridiated by different laser power densities [36]
Fig. 8. Damage morphologies induced by different power densities
Fig. 9. Vertical temperature distribution in first 30 s under 3 000 W/cm2 laser irradiation
Fig. 10. Simulation and measurement results of the normalized ransmitted power of the probe laser after the analyzer[37]
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