• Opto-Electronic Advances
  • Vol. 7, Issue 1, 230034 (2024)
Wei Yin1、2、3、†, Yuxuan Che1、2、3、†, Xinsheng Li1、2、3, Mingyu Li1、2、3, Yan Hu1、2、3, Shijie Feng1、2、3、*, Edmund Y. Lam4、**, Qian Chen3、***, and Chao Zuo1、2、3、****
Author Affiliations
  • 1Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2Smart Computational Imaging Research Institute (SCIRI) of Nanjing University of Science and Technology, Nanjing 210019, China
  • 3Jiangsu Key Laboratory of Spectral Imaging & Intelligent Sense, Nanjing 210094, China
  • 4Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam, Hong Kong SAR 999077, China
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    DOI: 10.29026/oea.2024.230034 Cite this Article
    Wei Yin, Yuxuan Che, Xinsheng Li, Mingyu Li, Yan Hu, Shijie Feng, Edmund Y. Lam, Qian Chen, Chao Zuo. Physics-informed deep learning for fringe pattern analysis[J]. Opto-Electronic Advances, 2024, 7(1): 230034 Copy Citation Text show less
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    Wei Yin, Yuxuan Che, Xinsheng Li, Mingyu Li, Yan Hu, Shijie Feng, Edmund Y. Lam, Qian Chen, Chao Zuo. Physics-informed deep learning for fringe pattern analysis[J]. Opto-Electronic Advances, 2024, 7(1): 230034
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