• Journal of Semiconductors
  • Vol. 42, Issue 5, 052001 (2021)
S. Dlimi1, A. El kaaouachi1、2, L. Limouny1, and B. A. Hammou2
Author Affiliations
  • 1Physics Department, Faculty of Sciences, Ibn Zohr University, BP 8106, Hay Dakhla, 80000 Agadir, Morocco
  • 2Materials and Physicochemistry of the Atmosphere and Climate Group, Faculty of Sciences, Ibn Zohr University, BP 8106, 80000 Agadir, Morocco
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    DOI: 10.1088/1674-4926/42/5/052001 Cite this Article
    S. Dlimi, A. El kaaouachi, L. Limouny, B. A. Hammou. A crossover from Efros–Shklovskii hopping to activated transport in a GaAs two-dimensional hole system at low temperatures[J]. Journal of Semiconductors, 2021, 42(5): 052001 Copy Citation Text show less
    Adjustment of conductivity dependence of temperature for 2D p-GaAs system sample for different carrier densities.
    Fig. 1. Adjustment of conductivity dependence of temperature for 2D p-GaAs system sample for different carrier densities.
    ln(σ) as (a) T–1/2, (b) T–1/3 and (c) T–1 of the sample and linear fits where the prefactor σ0 is independent on temperature.
    Fig. 2. ln(σ) as (a) T–1/2, (b) T–1/3 and (c) T–1 of the sample and linear fits where the prefactor σ0 is independent on temperature.
    Function lnW versus lnT for various densities.
    Fig. 3. Function lnW versus lnT for various densities.
    lnW as a function lnT and linear fits for both cases: T Tc and T > Tc.
    Fig. 4. lnW as a function lnT and linear fits for both cases: T < Tc and T > Tc.
    The exponent p as a function of carrier densities.
    Fig. 5. The exponent p as a function of carrier densities.
    (a) Activation energy versus np in the insulating phase. (b) Characteristic temperature for case of Efros-Shklovskii and Mott hopping.
    Fig. 6. (a) Activation energy versus np in the insulating phase. (b) Characteristic temperature for case of Efros-Shklovskii and Mott hopping.
    S. Dlimi, A. El kaaouachi, L. Limouny, B. A. Hammou. A crossover from Efros–Shklovskii hopping to activated transport in a GaAs two-dimensional hole system at low temperatures[J]. Journal of Semiconductors, 2021, 42(5): 052001
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