• Laser & Optoelectronics Progress
  • Vol. 58, Issue 4, 0410008 (2021)
Mengfan Ren, Lei Zhu*, Xiaomin Ma, and Lin Cui
Author Affiliations
  • School of Electronics and Information, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
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    DOI: 10.3788/LOP202158.0410008 Cite this Article Set citation alerts
    Mengfan Ren, Lei Zhu, Xiaomin Ma, Lin Cui. Fabric Defect Detection Method Based on Coarseness Measurement and Color Distance[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410008 Copy Citation Text show less
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    The article is cited by 2 article(s) from Researching.
    Mengfan Ren, Lei Zhu, Xiaomin Ma, Lin Cui. Fabric Defect Detection Method Based on Coarseness Measurement and Color Distance[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410008
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