• Acta Optica Sinica
  • Vol. 33, Issue 11, 1122002 (2013)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: 10.3788/aos201333.1122002 Cite this Article Set citation alerts
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Polarization Analysis of a Real High Numerical Aperture Optical LithographyLuo Hongmei[J]. Acta Optica Sinica, 2013, 33(11): 1122002 Copy Citation Text show less

    Abstract

    Based on the polarization transmission theory in optical system, the polarization analysis of a real high numerical aperture (NA) refractive optical lithography system is made, where the anti-reflection coating within current technology, the absorption in coating and base, and polarized illumination are taken into account to obtain a higher-reliability result. Several polarization parameters at every optical interface are calculated, such as transmission, reflection, absorptance and diattenuation, to achieve the effects of anti-reflection coating, absorption of the materials and polarized illumination on transmission performance and imaging performance. The results reveal that the anti-reflection coating can dramatically enhance the performance and stability of this sample system, while reducing the effects of varied polarized illumination to a negligible degree. Besides, the dramatic absorption in the base material plays a main role in the intensity loss, and the absorption has a small contribution to overall polarization effects.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Polarization Analysis of a Real High Numerical Aperture Optical LithographyLuo Hongmei[J]. Acta Optica Sinica, 2013, 33(11): 1122002
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