Qiaoyue Li, Gangcheng Shang, Qiang Tian, Xi Chen, Xixi Han, Yu Zhou, Leida Li. No-Reference Quality Assessment Method of Evaluating Scanning Electron Microscopy Images Based on Multi-Scale Characteristics[J]. Laser & Optoelectronics Progress, 2018, 55(11): 111005
- Laser & Optoelectronics Progress
- Vol. 55, Issue 11, 111005 (2018)
Fig. 1. Illustration of interactive system used in subjective viewing experiments
Fig. 2. (a) Clear SEM images and (b)(c) corresponding contrast distortion images
Fig. 3. Flow chart of proposed method
Fig. 4. F statistics of the other metrics against the proposed method
| |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Table 1. Results of mainstream quality assessment methods and proposed method tested in the SEM database
|
Table 2. Statistical performance results of compared metrics against the proposed method
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20