Fig. 1. Diagram of the FMF cross-section structure. (a) Geometrical structure and relative refractive index difference profile; (b) scanning electron microscope micrograph
Fig. 2. Structure of the SFS
Fig. 3. Simulation curves of the propagation constant difference Δβ of LP01 and the LP02 modes propagating in the FMF, and the transmission spectrum of the SFS structure (LFMF=50 cm) under the temperature of 25 ℃ versus wavelength
Fig. 4. Simulation curves of the propagation constant difference Δβ of the LP01 and LP02 modes propagating in the FMF, and the transmission spectra of the SFS structure (LFMF=16 cm) versus wavelength when temperature changes. (a) Δβ without thermal stress; (b) Δβ with thermal stress; (c) transmission spectra without thermal stress;(d) transmission spectra with thermal stress
Fig. 5. Experimental transmission spectra of the SFS structure (LFMF=16 cm) and critical wavelength shifts when temperature changes. (a) Experimental transmission spectra of the SFS structure; (b) critical wavelength shift versus temperature
Fig. 6. Transmission spectra of the SFS structure (LFMF=50 cm) versus temperature
Fig. 7. Simulated and experimental results of temperature sensitivity of the interference fringes in the transmission spectrum of the SFS structure
Fig. 8. Simulation curves of propagation constant difference Δβ of the LP01 and LP02 modes propagating in the FMF under axial strain variation
Fig. 9. Results of experimental measurements. (a) Transmission spectra of the SFS structure (LFMF=30 cm) under axial strain variation; (b) critical wavelength shift of CWL versus axial strain
Fig. 10. Relationship between axial strain sensitivity of the interference fringes in the transmission spectrum of the SFS structure and normalized wavelength
Fig. 11. Output of sensor containing the SFS structure (LFMF=20 cm) varies with temperature and axial strain. (a) Wavelength shifts for PH, 1 and PL, 1 over a 30-min period of the experiment; (b) curves of the applied and calculated axial strains over that time; (c) curves of the applied and calculated temperatures
Fig. 12. Sensor outputs of the polyimide-coated SFS structure (LFMF=15 cm) under relative humidity variation. (a) Transmission spectra; (b) wavelength shifts of interference dips DL, 1, DL, 2, DL, 3, and DL, 4
Fig. 13. Simulation of the propagation constant difference Δβ of LP01 and LP02 modes, and the transmission spectra of the SFS structure (LFMF=35 cm) versus wavelength with different equivalent curvatures of the FMF
Fig. 14. Experimental results of the transmission spectra of the SFS structure (LFMF=35 cm) versus wavelength with different curvatures of the FMF
Fig. 15. Simulation and experimental results of the critical wavelength shift versus equivalent curvature of the FMF
Fig. 16. Displacement sensor with large measurement range based on the SFS structure (LFMF=10 cm). (a) Experimental diagram; (b) experimental setup; (c) geometrical mathematical model of circular helix
Fig. 17. Large displacement sensor based on the SFS structure (LFMF=10 cm). (a) Transmission spectra under different displacements; (b) change of the FMF equivalent curvature and shifts of the critical wavelengths under displacement variation
Fig. 18. Simulation of the critical wavelength shifts in the transmission spectra of the etched SFS structure with different dFMF. The inset is the simulation of the propagation constant difference of the LP01 and LP02 modes versus wavelength with different dFMF
Fig. 19. Transmission spectra of the etched SFS structure (LFMF=20 cm, dFMF=21.3 μm) under different SRIs. (a) SRI is 1.316;(b) SRI is 1.383;(c) SRI is 1.423;(d) SRI is 1.439
Fig. 20. Experimental results (marked with error bars) of the critical wavelength shift in the transmission spectrum of the etched SFS structure under surrouding refractive index variation
Fig. 21. Simulation of the transmission spectra of the etched SFS structure (dFMF=21.3 μm, LFMF=20 cm) and shifts of the critical wavelength and the interference peaks/dips under surrounding refractive index variation. (a) Shifts of the critical wavelength and the interference peaks/dips (DL,1, PL,1, PH,1, DH,1) on each side of the critical wavelength; (b) transmission spectra under the SRIs of 1.350, 1.355, and 1.360
Measurementparameter | Measurement index | Experimental sensitivity | Sensing applications |
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Temperature | Criticalwavelength | 0.0401 nm·℃-1 | Temperature measurementin a large measurementrange (up to a maximum of 800 ℃) | Temperature | Interferencepeak /dip | Sensitivity of the interferencepeak is governed by the wavelengthspacing between the peakwavelength and the critical wavelength;the sensitivities of the interferencepeaks increase significantly with thedecreasing of wavelengthspacing; the maximum temperaturesensitivity of the interference peaksfor an SFS structure employinga 30-cm FMF is 0.482 nm·℃-1 | Temperature measurementwith a high sensitivity, simultaneousmeasurement of temperatureand other environmentalvariables such as strain | Strain | Critical wavelength | -0.001 nm·με-1 | Strain measurement ina large measurement range | Strain | Interferencepeak/dip | Similar as the temperaturesensitivity, the strain sensitivity of theinterference peak is governedby the wavelength spacing betweenthe peak wavelength and the criticalwavelength, and increases significantlywith the decreasing of wavelengthspacing; the maximum strain sensitivityof the interference peaks for anSFS structure employing a 30-cmFMF is -0.027 nm·℃-1 | Strain measurement withhigh sensitivity; simultaneousmeasurement of strain and temperature | Relative humidity | Interference dip | -0.360 nm for perrelative humidity change | Relative humidity measurementwith a high sensitivity | Curvature | Critical wavelength | 0.398 nm/m-1 | Curvaturemeasurement ina large measurement range; largedisplacement measurementwith different measurement ranges | Surroundingrefractive index | Criticalwavelength | Maximum reflectiveindex sensitivity is2489.796 nm·RIU-1 | Liquid reflective index measurementwith a large measurementrange up to 1.454 under 532 nm |
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Table 1. Summary of the SFS sensing structure with critical wavelength and its applications in different sensing parameters