• Spectroscopy and Spectral Analysis
  • Vol. 40, Issue 11, 3394 (2020)
Jie TONG1、1, Yu-qing LEI1、1, Ying-feng LI1、1, Mei-cheng LI1、1, Ming-hao ZHANG1、1, and Zhong-liang GAO1、1
Author Affiliations
  • 1[in Chinese]
  • 11. China Electric Power Research Institute, Beijing 100192, China
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    DOI: 10.3964/j.issn.1000-0593(2020)11-3394-05 Cite this Article
    Jie TONG, Yu-qing LEI, Ying-feng LI, Mei-cheng LI, Ming-hao ZHANG, Zhong-liang GAO. Influence of Incident Angle and Polarization on Spectral Behaviors of Tapered Silicon Nanowire[J]. Spectroscopy and Spectral Analysis, 2020, 40(11): 3394 Copy Citation Text show less
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    Jie TONG, Yu-qing LEI, Ying-feng LI, Mei-cheng LI, Ming-hao ZHANG, Zhong-liang GAO. Influence of Incident Angle and Polarization on Spectral Behaviors of Tapered Silicon Nanowire[J]. Spectroscopy and Spectral Analysis, 2020, 40(11): 3394
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