Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry

Tang Chen; Ren Hongwei; Chen Xia; Cai Yuanxue; Han Lin; Zhang Fang; Lu Wenjing; Wang Wenping; Wang Zhifang; Gao Tao

doi:10.3788/lop47.021201

Journals >Laser & Optoelectronics Progress >Volume 47 >Issue 2 >Page 21201 > Article

Laser & Optoelectronics Progress
Vol. 47, Issue 2, 21201 (2010)

Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry

Tang Chen^1、2、*, Ren Hongwei², Chen Xia¹, Cai Yuanxue³, Han Lin¹, Zhang Fang¹, Lu Wenjing¹, Wang Wenping¹, Wang Zhifang¹, and Gao Tao¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10.3788/lop47.021201 Cite this Article Set citation alerts

Tang Chen, Ren Hongwei, Chen Xia, Cai Yuanxue, Han Lin, Zhang Fang, Lu Wenjing, Wang Wenping, Wang Zhifang, Gao Tao. Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry[J]. Laser & Optoelectronics Progress, 2010, 47(2): 21201 Copy Citation Text

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