An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping

Ronghui Guo; Yihua Zhang; Haihua Cui; Xiaosheng Cheng; Lanzhu Li

doi:10.3788/LOP202158.2012002

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 20 >Page 2012002 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 20, 2012002 (2021)

An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping

Ronghui Guo¹, Yihua Zhang¹, Haihua Cui^1、*, Xiaosheng Cheng¹, and Lanzhu Li²

Author Affiliations

¹College of Mechanical and Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China

²Institute of Aerospace Materials and Technology, Beijing 100048, China

show less

DOI: 10.3788/LOP202158.2012002 Cite this Article Set citation alerts

Ronghui Guo, Yihua Zhang, Haihua Cui, Xiaosheng Cheng, Lanzhu Li. An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping[J]. Laser & Optoelectronics Progress, 2021, 58(20): 2012002 Copy Citation Text

show less

Cited By

Article index updated: May. 18, 2024

Citation counts are provided from Researching.

The article is cited by 1 article(s) from Researching.

Download Citation

Set citation alerts for the article

Tools

Set citation alerts for the article

Save the article for my favorites

Paper Information