Fig. 1. Principle diagram of STED technology^[5]

Fig. 2. Principle diagram of STORM technology^[5]. (a) Principle diagram of STORM imaging; (b) process image of STORM imaging

Fig. 3. Principle diagram of SIM technology^[5]

Fig. 4. Experimental principle diagram of single photon source judgement ^[24]. (a) HBT interference experiment; (b) HOM interference experiment

Fig. 5. Principle diagram of super-resolution fluorescence microscopy based on antibunching

Fig. 6. Application of super-resolution fluorescence microscopy based on antibunching in confocal microscopy and wide field microscopy, respectively. (a) Confocal microscopy^[52];(b) wide-field microscopy^[61]

Fig. 7. Experimental setup and results of GISC camera ^[75]. (a) Experimental setup of GISC camera; (b) reconstruction results of spectral images

Fig. 8. Principle diagram of GISC-Nanoscopy technology

Fig. 9. Experimental setup and results of GISC-Nanoscopy^[83]. (a) Experimental setup of GISC-Nanoscopy; (b) super-resolution imaging of ring with 80 nm spacing; (c) super-resolution imaging of DNA nanometer ruler with 160 nm spacing

Fig. 10. Results of GISC-STORM^[83]. (a) Comparison between original position and reconstructed position of simulated fluorescent molecules at density of 50.7 μm^-2; (b) ability to identify molecular densities at different SNRs; (c) localization precision of molecules at different SNRs and densities; (d) diffraction-limited wide field image of ring with 60 nm spacing; (e)--(h) sampling frames of ThunderSTORM, CS-STORM and GISC-STORM for resolving ring with 60 nm spacing