• Laser & Optoelectronics Progress
  • Vol. 58, Issue 19, 1905001 (2021)
Tong Zhang1, Fen Gao1、2、*, Bing Li2, and Ailing Tian1
Author Affiliations
  • 1School of Optoelectronic and Engineering, Xi'an Technological University, Xi'an , Shaanxi 710021, China
  • 2State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an , Shaanxi 710049, China
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    DOI: 10.3788/LOP202158.1905001 Cite this Article Set citation alerts
    Tong Zhang, Fen Gao, Bing Li, Ailing Tian. Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1905001 Copy Citation Text show less
    References

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    Tong Zhang, Fen Gao, Bing Li, Ailing Tian. Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1905001
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