• Laser & Optoelectronics Progress
  • Vol. 58, Issue 19, 1905001 (2021)
Tong Zhang1, Fen Gao1、2、*, Bing Li2, and Ailing Tian1
Author Affiliations
  • 1School of Optoelectronic and Engineering, Xi'an Technological University, Xi'an , Shaanxi 710021, China
  • 2State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an , Shaanxi 710049, China
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    DOI: 10.3788/LOP202158.1905001 Cite this Article Set citation alerts
    Tong Zhang, Fen Gao, Bing Li, Ailing Tian. Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1905001 Copy Citation Text show less
    Intensity distribution model of pinhole diffraction under Gaussian beam incidence
    Fig. 1. Intensity distribution model of pinhole diffraction under Gaussian beam incidence
    Diffraction field distribution models of pinhole under different alignment conditions.(a)Ideal condition;(b)shift error;(c)defocus error;(d)tilt error
    Fig. 2. Diffraction field distribution models of pinhole under different alignment conditions.(a)Ideal condition;(b)shift error;(c)defocus error;(d)tilt error
    Intensity distributions of pinhole diffraction under different waists (when d=2 μm). (a) Normalized intensity curve;(b) partially enlarged view
    Fig. 3. Intensity distributions of pinhole diffraction under different waists (when d=2 μm). (a) Normalized intensity curve;(b) partially enlarged view
    Diffraction intensity maps of pinhole with different shift errors (when d=2 μm). (a) dx=0 μm; (b) dx=0.5 μm; (c) dx=1.0 μm; (d) dx=1.5 μm
    Fig. 4. Diffraction intensity maps of pinhole with different shift errors (when d=2 μm). (a) dx=0 μm; (b) dx=0.5 μm; (c) dx=1.0 μm; (d) dx=1.5 μm
    Intensity normalization curves of pinhole diffraction under different shift error (when d=2 μm). (a) Normalized intensity curves; (b) partially enlarged view
    Fig. 5. Intensity normalization curves of pinhole diffraction under different shift error (when d=2 μm). (a) Normalized intensity curves; (b) partially enlarged view
    Diffraction intensity maps of pinhole for different defocus errors (when d=2 μm). (a) dz=0; (b) dz=10d; (c) dz=20d; (d) dz=30d
    Fig. 6. Diffraction intensity maps of pinhole for different defocus errors (when d=2 μm). (a) dz=0; (b) dz=10d; (c) dz=20d; (d) dz=30d
    Intensity normalization curves of pinhole diffraction under different defocus error (when d=2 μm). (a) Normalized intensity curves; (b) partially enlarged view
    Fig. 7. Intensity normalization curves of pinhole diffraction under different defocus error (when d=2 μm). (a) Normalized intensity curves; (b) partially enlarged view
    Change of normalized intensity along with defocus error dz under different diameters
    Fig. 8. Change of normalized intensity along with defocus error dz under different diameters
    Diffraction intensity maps of pinhole for different tilt errors (when d=5 μm). (a) γ=0°; (b) γ=5°; (c) γ=10°; (d) γ=15°
    Fig. 9. Diffraction intensity maps of pinhole for different tilt errors (when d=5 μm). (a) γ=0°; (b) γ=5°; (c) γ=10°; (d) γ=15°
    Center offset value of diffraction spot Δy varying with tilt angle γ
    Fig. 10. Center offset value of diffraction spot Δy varying with tilt angle γ
    Tong Zhang, Fen Gao, Bing Li, Ailing Tian. Diffraction Intensity Distribution of Pinhole for Misaligned Gaussian Beam Incidence[J]. Laser & Optoelectronics Progress, 2021, 58(19): 1905001
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