A novel approach to the super-resolution pits readout--super-resolution reflective film technique was put forward, and its principle was analyzed in detail. By using Sb as the super-resolution reflective layer and the SiN as dielectric layer, the super-resolution pits with a diameter of 380 nm were read out by the readout optics system (the laser wavelength is 632.8 nm and numerical aperture is 0.40). The influence of the Sb thin film thickness on the readout signal was investigated, the results showed that the optimum Sb thin film thickness is 28～30 nm, and the maximum signal-noise ratio is 38～40 dB.