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    Journals >Laser & Optoelectronics Progress >Volume 51 >Issue 11 >Page 111203 > Article
    • Laser & Optoelectronics Progress
    • Vol. 51, Issue 11, 111203 (2014)
    Study of Profilometry Measurement Precision Improvement Based on Morlet Wavelet Transform
    Zheng Yi*, Chen Wenjing, Zhong Min, and Shen Qiujue
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    DOI: 10.3788/lop51.111203 Cite this Article Set citation alerts
    Zheng Yi, Chen Wenjing, Zhong Min, Shen Qiujue. Study of Profilometry Measurement Precision Improvement Based on Morlet Wavelet Transform[J]. Laser & Optoelectronics Progress, 2014, 51(11): 111203 Copy Citation Text show less
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    Zheng Yi, Chen Wenjing, Zhong Min, Shen Qiujue. Study of Profilometry Measurement Precision Improvement Based on Morlet Wavelet Transform[J]. Laser & Optoelectronics Progress, 2014, 51(11): 111203
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