Cross-Scale Registration Method Based on Fractal Dimension Characterization

Chengwei Mo; Haihua Cui; Xiaosheng Cheng; Haibin Yao

doi:10.3788/AOS201838.1215001

Journals >Acta Optica Sinica >Volume 38 >Issue 12 >Page 1215001 > Article

Acta Optica Sinica
Vol. 38, Issue 12, 1215001 (2018)

Cross-Scale Registration Method Based on Fractal Dimension Characterization

Chengwei Mo^1、*, Haihua Cui^1、*, Xiaosheng Cheng¹, and Haibin Yao²

Author Affiliations

¹ College of Electrical and Mechanical, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China

² Yangzhou Polytechnic College, Yangzhou, Jiangsu 225009, China

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DOI: 10.3788/AOS201838.1215001 Cite this Article Set citation alerts

Chengwei Mo, Haihua Cui, Xiaosheng Cheng, Haibin Yao. Cross-Scale Registration Method Based on Fractal Dimension Characterization[J]. Acta Optica Sinica, 2018, 38(12): 1215001 Copy Citation Text

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References

Chengwei Mo, Haihua Cui, Xiaosheng Cheng, Haibin Yao. Cross-Scale Registration Method Based on Fractal Dimension Characterization[J]. Acta Optica Sinica, 2018, 38(12): 1215001

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