• Acta Optica Sinica
  • Vol. 38, Issue 7, 731002 (2018)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
DOI: 10.3788/aos201838.0731002 Cite this Article Set citation alerts
[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Influence of Deposition Process on Reliability of YbF3 Thin Films[J]. Acta Optica Sinica, 2018, 38(7): 731002 Copy Citation Text show less
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