• Microelectronics
  • Vol. 52, Issue 2, 197 (2022)
MAO Haiyan1, LAI Fan2, XIE Jiazhi2, and ZHANG Jian2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.210413 Cite this Article
    MAO Haiyan, LAI Fan, XIE Jiazhi, ZHANG Jian. Research on the Development Trends of Radiation Hardened Technology[J]. Microelectronics, 2022, 52(2): 197 Copy Citation Text show less
    References

    [14] ROCKETT L, PATEL D, DANZIGER S, et al. Radiation hardened FPGA technology for space applications [C]// IEEE Aerospace Conf. Big Sky, MT, USA. 2007.

    [15] SHANEYFELT M, SCHWANK J, FLEETWOOD D, et al. Annealing behavior of linear bipolar devices with enhanced low-dose-rate sensitivity [J]. IEEE Trans Nucl Sci, 2004, 51(6): 3172-3177.

    [16] FLEETWOOD D, EISEN H. Total-dose radiation hardness assurance [J]. IEEE Trans Nucl Sci, 2003, 50(3): 552-564.

    [17] PHAM T T, EL-GENK M S. Dose estimates in a lunar shelter with regolith shielding [J]. Acta Astronautica, 2009, 64(7/8): 697-713.

    MAO Haiyan, LAI Fan, XIE Jiazhi, ZHANG Jian. Research on the Development Trends of Radiation Hardened Technology[J]. Microelectronics, 2022, 52(2): 197
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