• Opto-Electronic Advances
  • Vol. 6, Issue 8, 220148 (2023)
Ruichao Zhu1, Jiafu Wang1、*, Tianshuo Qiu1, Dingkang Yang2, Bo Feng1, Zuntian Chu1, Tonghao Liu1, Yajuan Han1, Hongya Chen1, and Shaobo Qu1、**
Author Affiliations
  • 1Shaanxi Key Laboratory of Artificially-Structured Functional Materials and Devices, Air Force Engineering University, Xi'an 710051, China
  • 2The Academy for Engineering & Technology, Fudan University, Shanghai 200433, China
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    DOI: 10.29026/oea.2023.220148 Cite this Article
    Ruichao Zhu, Jiafu Wang, Tianshuo Qiu, Dingkang Yang, Bo Feng, Zuntian Chu, Tonghao Liu, Yajuan Han, Hongya Chen, Shaobo Qu. Direct field-to-pattern monolithic design of holographic metasurface via residual encoder-decoder convolutional neural network[J]. Opto-Electronic Advances, 2023, 6(8): 220148 Copy Citation Text show less
    Schematic diagram of CAHM monolithic design via REDCNN model
    Fig. 1. Schematic diagram of CAHM monolithic design via REDCNN model
    REDCNN model design and feature extraction. (a) The architecture and dimension of REDCNN model. (b) The downsampling process of feature encoder. (c) The upsampling process of feature decoder. (d) Feature transfer of different channels in encoding process. (e) Feature transfer of different channels in decoding process
    Fig. 2. REDCNN model design and feature extraction. (a) The architecture and dimension of REDCNN model. (b) The downsampling process of feature encoder. (c) The upsampling process of feature decoder. (d) Feature transfer of different channels in encoding process. (e) Feature transfer of different channels in decoding process
    Training and test of the REDCNN model. (a) The variation of MAE loss value in deep learning process. (b) The variation of MAE loss value in transfer learning process. (c) The error histogram of deep learning in training set. (d) The error histogram of deep learning in test set. (e) The error histogram of transfer learning in training set. (f) The error histogram of transfer learning in test set.
    Fig. 3. Training and test of the REDCNN model. (a) The variation of MAE loss value in deep learning process. (b) The variation of MAE loss value in transfer learning process. (c) The error histogram of deep learning in training set. (d) The error histogram of deep learning in test set. (e) The error histogram of transfer learning in training set. (f) The error histogram of transfer learning in test set.
    The comparison of predicted metasurface and real metasurface with error distributions. (a) Input images. (b) Phase profiles of metasurface. (c) Amplitude profiles of metasurface. (d) Theoretical electric field distributions calculated by diffraction theory. (e) Simulated electric field distributions.
    Fig. 4. The comparison of predicted metasurface and real metasurface with error distributions. (a) Input images. (b) Phase profiles of metasurface. (c) Amplitude profiles of metasurface. (d) Theoretical electric field distributions calculated by diffraction theory. (e) Simulated electric field distributions.
    Measurement verification and comparation of the metasurfaces. (a) Photograph of fabricated metasurface prototype. (b, c) Photograph of orthogonal metal gratings. (d) Photograph of real metasurface pattern. (e) Photograph of predicted metasurface pattern. (f) Electric-field measurement environment in microwave anechoic chamber. (g) Measured electric field distribution of real metasurface. (h) Measured electric field distribution of predicted metasurface. (i) The error of measured electric field distribution between the real and predicted metasurfaces
    Fig. 5. Measurement verification and comparation of the metasurfaces. (a) Photograph of fabricated metasurface prototype. (b, c) Photograph of orthogonal metal gratings. (d) Photograph of real metasurface pattern. (e) Photograph of predicted metasurface pattern. (f) Electric-field measurement environment in microwave anechoic chamber. (g) Measured electric field distribution of real metasurface. (h) Measured electric field distribution of predicted metasurface. (i) The error of measured electric field distribution between the real and predicted metasurfaces
    Ruichao Zhu, Jiafu Wang, Tianshuo Qiu, Dingkang Yang, Bo Feng, Zuntian Chu, Tonghao Liu, Yajuan Han, Hongya Chen, Shaobo Qu. Direct field-to-pattern monolithic design of holographic metasurface via residual encoder-decoder convolutional neural network[J]. Opto-Electronic Advances, 2023, 6(8): 220148
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