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[9] Ying Shang-Ping, Fu Han-Kuei, Hsieh Hsin-Hsin, et al. IEEE Transactions on Electron Devices, 2017, 64(3): 1088.
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[9] Ying Shang-Ping, Fu Han-Kuei, Hsieh Hsin-Hsin, et al. IEEE Transactions on Electron Devices, 2017, 64(3): 1088.
[10] Ying S P, Shen J Y. Opt. Lett., 2016, 41(9): 1989.
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