• Infrared and Laser Engineering
  • Vol. 51, Issue 6, 20210430 (2022)
Jiatian Wang1、2, Chuang Liu1、2, Jiaojiao Ren1、2, Dandan Zhang1、2, and Jian Gu1、2
Author Affiliations
  • 1Key Laboratory of Photoelectric Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • 2National Demonstration Center for Experimental Opto-Electronic Engineering Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
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    DOI: 10.3788/IRLA20210430 Cite this Article
    Jiatian Wang, Chuang Liu, Jiaojiao Ren, Dandan Zhang, Jian Gu. Terahertz time domain characterization method of the adhesive layer uniformity in multiple bonding structures[J]. Infrared and Laser Engineering, 2022, 51(6): 20210430 Copy Citation Text show less
    Schematic diagram of terahertz time-domain spectroscopy system
    Fig. 1. Schematic diagram of terahertz time-domain spectroscopy system
    Schematic diagram of multiple bonding structure and terahertz time-domain waveform
    Fig. 2. Schematic diagram of multiple bonding structure and terahertz time-domain waveform
    Schematic diagram of flight time at different positions of upper adhesive layer
    Fig. 3. Schematic diagram of flight time at different positions of upper adhesive layer
    [in Chinese]
    Fig. 4. [in Chinese]
    Flight time of difference imaging of different experimental samples
    Fig. 4. Flight time of difference imaging of different experimental samples
    Energy integral diagram of different thickness of upper rubber layer
    Fig. 5. Energy integral diagram of different thickness of upper rubber layer
    Energy integration imaging of different experimental samples
    Fig. 6. Energy integration imaging of different experimental samples
    Energy integration curves of different experimental samples
    Fig. 7. Energy integration curves of different experimental samples
    Schematic diagram of amplitude variation of different thickness of upper adhesive layer
    Fig. 8. Schematic diagram of amplitude variation of different thickness of upper adhesive layer
    Amplitude imaging of different experimental samples
    Fig. 9. Amplitude imaging of different experimental samples
    Sample number1234
    Standard deviation of flight time8.78%8.09%7.30%9.57%
    Table 1. Relative standard deviation of flight time of different experimental samples
    Sample number1234
    Energy value standard deviation 0.950.90.711.01
    Table 2. Energy standard deviation of different experimental samples
    Sample number1234
    Amplitude dispersion coefficient0.600.580.520.63
    Table 3. Amplitude dispersion coefficient of different experimental samples
    Jiatian Wang, Chuang Liu, Jiaojiao Ren, Dandan Zhang, Jian Gu. Terahertz time domain characterization method of the adhesive layer uniformity in multiple bonding structures[J]. Infrared and Laser Engineering, 2022, 51(6): 20210430
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