• Infrared and Laser Engineering
  • Vol. 51, Issue 6, 20210430 (2022)
Jiatian Wang1、2, Chuang Liu1、2, Jiaojiao Ren1、2, Dandan Zhang1、2, and Jian Gu1、2
Author Affiliations
  • 1Key Laboratory of Photoelectric Measurement and Optical Information Transmission Technology of Ministry of Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • 2National Demonstration Center for Experimental Opto-Electronic Engineering Education, College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
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    DOI: 10.3788/IRLA20210430 Cite this Article
    Jiatian Wang, Chuang Liu, Jiaojiao Ren, Dandan Zhang, Jian Gu. Terahertz time domain characterization method of the adhesive layer uniformity in multiple bonding structures[J]. Infrared and Laser Engineering, 2022, 51(6): 20210430 Copy Citation Text show less

    Abstract

    Multilayer bonding structure is widely used in aerospace field, and its bonding strength is the key factor to ensure engineering safety. Different terahertz time-domain spectroscopy parameters such as time-of-flight, energy and amplitude were used to characterize the uniformity of the adhesive layer of multilayer bonding structure, and then evaluate the bonding quality of multilayer bonding structure materials. The uniformity of the adhesive layer was qualitatively analyzed by the terahertz time-domain spectroscopy time-of-flight imaging method. The relative standard deviations of flight time of four experimental samples are 8.78%, 8.09%, 7.30% and 9.57% respectively; Using the energy integration information of terahertz time-domain spectroscopy, the kurtosis and skewness of the energy integration curve were used to qualitatively analyze the uniformity of the adhesive layer. The energy standard deviations of four experimental samples were 0.95, 0.9, 0.71 and 1.01, respectively; In addition, according to the amplitude characteristic information of terahertz time-domain spectroscopy, the uniformity of adhesive layer was quantitatively characterized by amplitude dispersion coefficient. The results show that the time-of-flight, energy integral and amplitude of terahertz time-domain spectroscopy can be use to quantitatively evaluate the adhesive layer uniformity of multi-layer adhesive structures. This method can provide a reliable means for evaluating the adhesive strength of multi-layer adhesive structures.
    Jiatian Wang, Chuang Liu, Jiaojiao Ren, Dandan Zhang, Jian Gu. Terahertz time domain characterization method of the adhesive layer uniformity in multiple bonding structures[J]. Infrared and Laser Engineering, 2022, 51(6): 20210430
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