• Acta Optica Sinica
  • Vol. 33, Issue 1, 112006 (2013)
Cao Shaoqian1、2、*, Bu Yang1, Wang Xiangzhao1, Li Sikun1, Tang Feilong1、2, and Li Zhongliang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/aos201333.0112006 Cite this Article Set citation alerts
    Cao Shaoqian, Bu Yang, Wang Xiangzhao, Li Sikun, Tang Feilong, Li Zhongliang. Measurement Technique for the Mueller Matrix Based on a Single Photo-Elastic Modulator[J]. Acta Optica Sinica, 2013, 33(1): 112006 Copy Citation Text show less
    References

    [1] M. Losurdo, M. M. Giangregorio, P. Capezzuto et al.. Structural and optical properties of nanocrystalline Er2O3 thin films deposited by a versatile low-pressure MOCVD approach [J]. J. Electrochem. Soc., 2008, 155(2): G44~G50

    [2] M. Losurdo, M. Bergmair, G. Bruno. Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives [J]. J. Nanopart. Res., 2009, 11(7): 1521~1554

    [3] G. R. McIntyre, J. Kye, H. Levinson et al.. Polarization aberrations in hyper-numerical-aperture projection printing: a comparison of various representations [J]. Microlith., Microfab. Microsyst., 2006, 5(3): 033001

    [4] S. B. Hatit, M. Foldyna, A. D. Martino et al.. Angle-resolved Mueller polarimeter using a microscope objective [J]. Phys. Stat. Sol. (A)., 2008, 205(4): 743~747

    [5] R. A. Chipman. Handbook of Optics [M]. New York: McGraw Hill, Inc., 1995

    [6] D. H. Goldstein. Mueller matrix dual-rotating retarder polarimeter [J]. Appl. Opt., 1992, 31(31): 6676~6683

    [7] R. W. Collins, J. Koh. Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films [J]. J. Opt. Soc. Am. A, 1999, 16(8): 1997~2006

    [8] I. J. Vaughn, B. G. Hoover. Noise reduction in a laser polarimeter based on discrete waveplate rotations [J]. Opt. Express, 2008, 16(3): 2091~2108

    [9] A. D. Martino, Y. K. Kim, E. Garcia-Caurel et al.. Optimized Mueller polarimeter with liquid crystals [J]. Opt. Lett., 2003, 28(8): 616~618

    [10] D. Goldstein. Polarized Light [M]. New York: Marcel Dekker, Inc., 2003

    [11] Aijun Zeng, Fanyue Li, Linglin Zhu et al.. Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photoelastic modulator [J]. Appl. Opt., 2011, 50(22): 4347~4352

    [12] Y. W. Liu, G. A. Jones, Y. Peng et al.. Generalized theory and application of Stokes parameter measurements made with a single photoelastic modulator [J]. Appl. Phys., 2006, 100(6): 063537

    [13] B. Wang, T. C. Oakberg. A new instrument for measuring both the magnitude and angle of low level linear birefringence [J]. Rev. Sci. Instrum., 1999, 70(10): 3847~3854

    [14] W. Guan, G. A. Jones, Y. W. Liu et al.. The measurement of the Stokes parameters: a generalized methodology using a dual photoelastic modulator system [J]. Appl. Phys., 2008, 49(14): 2644~2652

    [15] Y. Takakura, J. E. Ahmad. Noise distribution of Mueller matrices retrieved with active rotating polarimeters [J]. Appl. Opt., 2007, 46(30): 7354~7364

    [16] A. Ambirajan, D. C. Look. Optimum angles for a polarimeter: part 1 [J]. Opt. Eng., 1995, 34(6): 1651~1655

    [17] Yang Kun, Zeng Aijun, Wang Xiangzhao et al.. Fast axis calibration of quarter-wave plate by fundamental component extinction [J]. Chinese J. Lasers, 2007, 34(11): 1554~1556

    [18] Hu Jianming, Zeng Aijun, Wang Xiangzhao. Method to measure phase retardation of wave plate based on photoelastic modulation [J]. Acta Optica Sinica, 2006, 26(11): 1681~1686

    [19] Zeng Aijun, Wang Xiangzhao, Dong Zuoren et al.. Application of photoelastic modulator in modulation of polarization direction [J]. Chinese J. Lasers, 2005, 32(8): 1063~1067

    [20] Zeng Aijun, Wang Xiangzhao, Li Dailin et al.. A new method to calibrate accurately a photoelastic modulator [J]. Acta Optica Sinica, 2005, 25(6): 799~802

    [21] Baoliang Wang, T. C. Oakberg. A new instrument for measuring both the magnitude and angle of low level linear birefringence [J]. Rev. Sci. Instrum., 1999, 70(10): 3847~3854

    [22] Li Fanyue, Han Jie, Zeng Aijun et al.. Method for measuring retardation by swinging quarter-wave plate with phase modulator [J]. Chinese J. Lasers, 2011, 38(2): 0208003

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    [3] Feng Jinhua, Hu Song, Li Yanli, He Yu. Nano Focusing Method Based on Moire Fringe Phase Analysis[J]. Acta Optica Sinica, 2015, 35(2): 212005

    Cao Shaoqian, Bu Yang, Wang Xiangzhao, Li Sikun, Tang Feilong, Li Zhongliang. Measurement Technique for the Mueller Matrix Based on a Single Photo-Elastic Modulator[J]. Acta Optica Sinica, 2013, 33(1): 112006
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