• Acta Optica Sinica
  • Vol. 20, Issue 10, 1378 (2000)
[in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article Set citation alerts
    [in Chinese]. The Principle of the Scatter Plate Interferometry Based on Statistical Optics[J]. Acta Optica Sinica, 2000, 20(10): 1378 Copy Citation Text show less
    References

    [1] Malacara D. Optical Shop Testing. New York: John Wiley & Sons. 1978. 71~73

    [3] Burch J M. Scatter fringes of equal thickness. Nature, 1953, 171:889~890

    [4] Burch J M. Scatter-fringe interferometry. J. Opt. Soc. Am., 1962, 52():600~

    [6] Scott R M. Scatter plate interferometry. Appl. Opt., 1969, 8():531~533

    [8] Goodman J W. Introduction to Fourier Optics. New York: McGraw-Hill, 1968.

    [9] Goodman J W. Statistical Optics. New York: John Wiley & Sons., 1985. 347~356

    [in Chinese]. The Principle of the Scatter Plate Interferometry Based on Statistical Optics[J]. Acta Optica Sinica, 2000, 20(10): 1378
    Download Citation