Research on the Nonlinearity Mitigation by Wavelet Transform Method in Modulation Profilometry

Zhong Min; Chen Feng; Xiao Chao

doi:10.3788/lop54.071205

[1] Su X Y, Zhang Q C. Dynamic 3D shape measurement method: a review［J］. Optics and Lasers in Engineering, 2010, 48(2): 191-204.

[2] Chen F, Brown G M, Song M M. Overview of three-dimensional shape measurement using optical methods［J］. Optics Engineering, 2000, 39(1): 10-22.

[3] Su Xianyu, Zhang Qican, Chen Wenjing. Structured light 3D imaging technology［J］. Chinese J Lasers, 2014, 41(2): 0209001.

[4] Takasaki H. Moiré topography［J］. Applied Optics, 1970, 9(6): 1467-1472.

[5] Zhao Hong, Chen Wenyi, Tan Yushan. Automatic shadow Moirétopography［J］. Acta Optica Sinica, 1995, 15(9): 1275-1277.

[6] Srinivasan V, Liu H C, Halioua M. Automated phase-measuring profilometry of 3D diffuse objects［J］. Applied Optics, 1984, 23(18): 3105-3108.

[7] Takeda M, Mutoh K. Fourier transform profilometry for the automatic measurement of 3-D object shapes［J］. Applied Optics, 1983, 22(24): 3977-3982.

[8] Zhong J G, Weng J W. Phase retrieval of optical fringe patterns from the ridge of a wavelet transform［J］. Optics Letters, 2005, 30(19): 2560-2562.

[9] Jiang Mohua, Chen Wenjing, Zheng Zhiping. Research of phase demodulation technique based on S-transform［J］. Acta Optica Sinica, 2011, 19(9): 04120001.

[10] Su X Y, Su LK, Li W S, et al. New 3D profilometry based on modulation measurement［J］. SPIE, 1998, 3558: 1-7.

[11] Su Likun, Su Xianyu, Li Wansong, et al. 3D profilometry based on modulation measurement［J］. Acta Optica Sinica, 1999, 19(9): 1257-1262.

[12] Zhong M, Chen F, Xiao C, et al. 3-D surface profilometry based on modulation measurement by applying wavelet transform method［J］. Optics and Lasers in Engineering, 2017, 88: 243-254.

[13] Nayar S K, Nakagawa Y. Shape from focus［J］. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1994, 16(8): 824-831.

[14] Subbarao M, Gurumoorthy N. Depth recovery from blurred edges［J］. IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 1988: 498-503.

[15] Gonzalez R C, Woods R E，Eddins S L. Digital image processing［M］. Ruan Qiuqi, Transl. 2nd ed. Beijing: Science Press, 2007: 63-66.

[16] Su Ke, Chen Wenjing. Analyzing wavelet transform profilometry in the restraining CCD nonlinear characteristic［J］. Optical Technique, 2009, 35(1): 37-40.

[17] Zhao Huandong, Zhu Bijin, Li Zhineng. Effect on the Fourier transform profilometry due to the CCD nonlinearity［J］. Optical Instruments, 2000, 22(5): 7-13.