• Opto-Electronic Engineering
  • Vol. 41, Issue 2, 12 (2014)
YUAN Kun1、2、*, YAN Huimin1, and JIN Shangzhong2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2014.02.003 Cite this Article
    YUAN Kun, YAN Huimin, JIN Shangzhong. Modified Model of Color Spectrophotometer SCI Condition Based on Gloss Analysis[J]. Opto-Electronic Engineering, 2014, 41(2): 12 Copy Citation Text show less
    References

    [1] CIE-15: 2004. Colorimetry [S]. Vienna: CIE Central Bureau,2004.

    [2] Weixel S. Measure color and gloss at the same time [J]. Industrial Paint and Powder,2005,81(8): 27-31.

    [3] Pan Y,Cui G,Luo M R. Gloss effect on color difference evaluation [C]// Proceedings of Midterm Meeting of the International Color Association,AIC 2007 Color Science for Industry,Hangzhou,China,July 12,2007: 199-202.

    [4] Dalal E N,Natale–Hoffman K M. The effect of gloss on color [J]. Color Research & Application(S1520-6378),1999,24(5): 369-376.

    [5] Ma Jian,XU Haisong,LUO M R,et al. Color appearance and visual measurements for color samples with gloss effect [J]. Chinese Optics Letters(S1671-7694),2009,7(9): 869-872.

    [6] Simonot L,Elias M. Color change due to a varnish layer [J]. Color Research & Application(S1520-6378),2004,29(3): 196-204.

    [7] Simonot L,Elias M. Color change due to a surface state modification [J]. Color Research & Application(S1520-6378),2003, 28(1): 45-49.

    [9] JI Wei,Pointer M R,LUO R M,et al. Gloss as an aspect of the measurement of appearance [J]. JOSA A(S1520-8532),2006, 23(1): 22-23.

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    YUAN Kun, YAN Huimin, JIN Shangzhong. Modified Model of Color Spectrophotometer SCI Condition Based on Gloss Analysis[J]. Opto-Electronic Engineering, 2014, 41(2): 12
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