• Opto-Electronic Engineering
  • Vol. 41, Issue 2, 12 (2014)
YUAN Kun1、2、*, YAN Huimin1, and JIN Shangzhong2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2014.02.003 Cite this Article
    YUAN Kun, YAN Huimin, JIN Shangzhong. Modified Model of Color Spectrophotometer SCI Condition Based on Gloss Analysis[J]. Opto-Electronic Engineering, 2014, 41(2): 12 Copy Citation Text show less

    Abstract

    When the surface color of the same material and different gloss objects is measured, in order to remove the color measurement impact caused by the surface gloss, the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination viewing conditions are mostly chosen. Ideally, because of the homogenization effect of integrating sphere on illumination light, the measurement result is not affected by the surface gloss. However, in the real instrument design, owing to the constraints in measuring structural design, the color measurement results of the test samples with the same spectral reflectance and different surface gloss are different. This paper theoretically analyzes the cause of the deviation in the illumination viewing condition of the diffuse illumination, the viewing angle of 8-degree illumination and specular component included illumination, when measuring the material surface color of different gloss. This paper also designs a measurement structure which can simultaneously measure the data of color and gloss, presents a correction model which can modify the SCI measured data according to the surface gloss data of the test sample, and then designs relevant experiments to test and verify. The experimental results show that, using the correction model for modifying the measurement structure, the measurement error can be significantly reduced.
    YUAN Kun, YAN Huimin, JIN Shangzhong. Modified Model of Color Spectrophotometer SCI Condition Based on Gloss Analysis[J]. Opto-Electronic Engineering, 2014, 41(2): 12
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