• Journal of Semiconductors
  • Vol. 40, Issue 7, 072902 (2019)
Qiang Li1、2, Ji-Yang Zhou1、2, Zheng-Hao Liu1、2, Jin-Shi Xu1、2, Chuan-Feng Li1、2, and Guang-Can Guo1、2
Author Affiliations
  • 1CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China
  • 2CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China
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    DOI: 10.1088/1674-4926/40/7/072902 Cite this Article
    Qiang Li, Ji-Yang Zhou, Zheng-Hao Liu, Jin-Shi Xu, Chuan-Feng Li, Guang-Can Guo. Stable single photon sources in the near C-band range above 400 K[J]. Journal of Semiconductors, 2019, 40(7): 072902 Copy Citation Text show less

    Abstract

    The intrinsic characteristics of single photons became critical issues since the early development of quantum mechanics. Nowadays, acting as flying qubits, single photons are shown to play important roles in the quantum key distribution and quantum networks. Many different single photon sources (SPSs) have been developed. Point defects in silicon carbide (SiC) have been shown to be promising SPS candidates in the telecom range. In this work, we demonstrate a stable SPS in an epitaxial 3C-SiC with the wavelength in the near C-band range, which is very suitable for fiber communications. The observed SPSs show high single photon purity and stable fluorescence at even above 400 K. The lifetimes of the SPSs are found to be almost linearly decreased with the increase of temperature. Since the epitaxial 3C-SiC can be conveniently nanofabricated, these stable near C-band SPSs would find important applications in the integrated photonic devices.
    $ {{{g}}^2}\left( {{\tau }} \right) = {{1}} - \left( {{{1}} + {{\varepsilon }}} \right){{\rm e}^{ - \frac{{\left| {{\tau }} \right|}}{{{{{\gamma }}_1}}}}} + {{a}}{{\rm e}^{ - \frac{{\left| {{\tau }} \right|}}{{{{{\gamma }}_2}}}}}, $ (1)

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    Qiang Li, Ji-Yang Zhou, Zheng-Hao Liu, Jin-Shi Xu, Chuan-Feng Li, Guang-Can Guo. Stable single photon sources in the near C-band range above 400 K[J]. Journal of Semiconductors, 2019, 40(7): 072902
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