• Journal of Infrared and Millimeter Waves
  • Vol. 39, Issue 1, 92 (2020)
Su-Yu MA1, Chuan-He MA1, Xiao-Shuang LU1, Guo-Shuai LI1, Lin SUN1, Ye CHEN1、*, Fang-Yu YUE1、*, and Jun-Hao CHU1、2
Author Affiliations
  • 1Key Laboratory of Polar Materials and Devices, School of Physics and Electronic Science, East China Normal University, Shanghai20024, China
  • 2National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai00083, China
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    DOI: 10.11972/j.issn.1001-9014.2020.01.013 Cite this Article
    Su-Yu MA, Chuan-He MA, Xiao-Shuang LU, Guo-Shuai LI, Lin SUN, Ye CHEN, Fang-Yu YUE, Jun-Hao CHU. Optical characterization of bandedge electronic structure and defect states in Cu2ZnSnS4[J]. Journal of Infrared and Millimeter Waves, 2020, 39(1): 92 Copy Citation Text show less

    Abstract

    The bandedge electronic structure including the optical bandgap, band-tail states, and deep/shallow donor and acceptor levels in Cu2ZnSnS4 semiconductor was analyzed by absorption, photocurrent and photoluminescence spectroscopy, and the theoretical reports. It is revealed that the SnZn-related defect in Cu2ZnSnS4 with abundant defect states is one of the key factors affecting the band-edge electronic structure. High concentration of the neutral defect cluster [2CuZn+SnZn] can narrow the band gap substantially, while the partially-passivated (ionic) defect cluster [CuZn+SnZn] is the main deep donor defect. A large number of band-tail states are responsible for the obvious red-shift of the bandedge-related photoluminescence transition energy. These detrimental defects related to SnZn can be effectively suppressed by properly reducing the Sn content in the copper-poor and zinc-rich growth condition, which also avoids the narrowing of the optical bandgap of the Cu2ZnSnS4 absorption layer.
    Su-Yu MA, Chuan-He MA, Xiao-Shuang LU, Guo-Shuai LI, Lin SUN, Ye CHEN, Fang-Yu YUE, Jun-Hao CHU. Optical characterization of bandedge electronic structure and defect states in Cu2ZnSnS4[J]. Journal of Infrared and Millimeter Waves, 2020, 39(1): 92
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