Author Affiliations
Key Laboratory of Photoelectronic Imaging Technology and System of Ministry of Education of China, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, Chinashow less
Fig. 1. Schematic diagram of a wide-view-angle Mueller polarimeter for measuring the Mueller pupil of projection optics.
Fig. 2. Experimental setup for measuring Mueller pupil of projection optics: 1, laser; 2, reflector; 3, beam expander; 4, uniformizer; 5, PSG; 6, projection optics; 7, focal plane; 8, collimating optics; 9, PSA; 10, CCD; 11, controller.
Fig. 3. Mueller matrices over two-dimensional distribution of air (a) before calibration and (b) after calibration.
Fig. 4. Mueller matrix over two-dimensional distribution of a QWP with its fast axis at 30° using the calibrated PSG and PSA. (a) The corresponding polarization parameters. (b) , diattenuation; , total retardance; , depolarization coefficient; , , linear retardance and fast-axis orientation; and , circular retardance.
Fig. 5. (a) Product of Mueller pupils of projection optics and collimating optics, ; (b) the Mueller pupil of collimating optics, ; (c) the Mueller pupil of projection optics, .
Fig. 6. Comparison of polarization parameters extracted from obtained , , and shown in Fig. 5.
Errors | Mean Value (°) |
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| 1.2034 | | 0.8425 | | −0.3839 | | −1.3407 | | −1.5470 |
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Table 1. Parameter Errors of PSG and PSA
| | |
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Mean | | | RMS | | | PV | | |
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Table 2. Corresponding Mean Values, RMS, and PV Values of Each Sub-Pupil of and in Fig. 5